Spectrally resolved complex transmittance measurements of infrared nanostructured devices

Julien Jaeck; Adrien Fallou; Grégory Vincent; Jérôme Primot; Jean-Luc Pelouard; Riad Haïdar

doi:10.1117/12.929742

13 September 2012 Spectrally resolved complex transmittance measurements of infrared nanostructured devices

Julien Jaeck, Adrien Fallou, Grégory Vincent, Jérôme Primot, Jean-Luc Pelouard, Riad Haïdar

Proceedings Volume 8493, Interferometry XVI: Techniques and Analysis; 849304 (2012) https://doi.org/10.1117/12.929742
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Optical sub-wavelength structures allow to code space-varying complex transmittance functions that induce both amplitude and phase variations on a given wavefront at the micrometer scale. This paves the way to the miniaturization of optical devices based on the spatial coding of the complex transmittance. We describe here a dedicated setup in the infrared range (3-14,um) for the spatial and spectral characterization of such components. The setup combines (i) a quadri-wave lateral shearing interferometer, which enables a two dimensional measurement of phase and amplitude, and (ii) a Fourier Transform Infrared Interferometer for spectral resolution. We present both theoretical simulations and experimental results of the characterization of subwavelength gratings.

Citation Download Citation

Julien Jaeck, Adrien Fallou, Grégory Vincent, Jérôme Primot, Jean-Luc Pelouard, and Riad Haïdar "Spectrally resolved complex transmittance measurements of infrared nanostructured devices", Proc. SPIE 8493, Interferometry XVI: Techniques and Analysis, 849304 (13 September 2012); https://doi.org/10.1117/12.929742

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