Interferometer inspection of local defect type Young-Chalmers

Benito Canales-Pacheco; Alejandro Cornejo-Rodriguez; Fermín Granados-Agustin; Esteban Rueda-Soriano; Pedro Cebrian-Xochihuila

doi:10.1117/12.930049

13 September 2012 Interferometer inspection of local defect type Young-Chalmers

Benito Canales-Pacheco, Alejandro Cornejo-Rodriguez, Fermín Granados-Agustin, Esteban Rueda-Soriano, Pedro Cebrian-Xochihuila

Author Affiliations +

Proceedings Volume 8494, Interferometry XVI: Applications; 84940O (2012) https://doi.org/10.1117/12.930049
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Using the analogy of the double-slit experiment developed by Young and using interferometric technique developed by Chalmers, we built an interferometric arrangement that can analyze local defects of an optical surface. With a reflective spatial light modulator (RSLM) controlled by a PC, two apertures are open each time, and the apertures became as secondary light sources, producing interference pattern for specific zones for the surface under test. The interference pattern is observed, and storage into a computer by using a CCD camera. Finally the results are compared with the results obtained using a Fizeau commercial interferometer.

Citation Download Citation

Benito Canales-Pacheco, Alejandro Cornejo-Rodriguez, Fermín Granados-Agustin, Esteban Rueda-Soriano, and Pedro Cebrian-Xochihuila "Interferometer inspection of local defect type Young-Chalmers", Proc. SPIE 8494, Interferometry XVI: Applications, 84940O (13 September 2012); https://doi.org/10.1117/12.930049

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