Estimating hemispherical scatter from incident plane measurements of isotropic samples

John C. Stover; Sven Schröder; Alexander von Finck; Angela Duparré

doi:10.1117/12.930773

15 October 2012 Estimating hemispherical scatter from incident plane measurements of isotropic samples

John C. Stover, Sven Schröder, Alexander von Finck, Angela Duparré

Proceedings Volume 8495, Reflection, Scattering, and Diffraction from Surfaces III; 84950F (2012) https://doi.org/10.1117/12.930773
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

In the mid-1970’s it became apparent that incident plane scatter data could be represented by simple two or three parameter expressions. This realization made possible the generation of stray light estimation codes which are used on everything from military weapons, to telescopes, to car headlights to flat panel display systems. Almost all of these applications estimate hemispherical scatter from incident plane measurements. For most of these applications estimates that are good to within a factor of three - or even an order of magnitude - are acceptable and can result in dramatic product improvements. This paper takes a closer look at how the out-of-incident-plane estimates are made and evaluates how accurate the process is for the case of optically rough isotropic surfaces. The estimating process is reviewed and estimates are compared to hemispherical scatter measurements. It will be shown how the empirical observations that led to the procedures now widely used can be understood using well-known scatter models that link the surface roughness and scattering properties.

Citation Download Citation

John C. Stover, Sven Schröder, Alexander von Finck, and Angela Duparré "Estimating hemispherical scatter from incident plane measurements of isotropic samples", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 84950F (15 October 2012); https://doi.org/10.1117/12.930773

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