Paper
24 October 2012 Some structural and optical properties of thin and thick CdTe and CdxMn1-xTe films
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Abstract
In work the complex investigation of structural and optical properties of CdTe and Cd1-xMnxTe semiconductor films deposited by close-spaced vacuum sublimation method using thermal evaporation on non-oriented substrates was carried out. The structural and phase analysis of the layers condensed at different substrate temperatures was performed.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. S. Opanasyuk, P. V. Koval, V. V. Kosyak, P. M. Fochuk, A. E. Bolotnikov, and R. B. James "Some structural and optical properties of thin and thick CdTe and CdxMn1-xTe films", Proc. SPIE 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV, 85071K (24 October 2012); https://doi.org/10.1117/12.929017
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Cited by 3 scholarly publications.
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KEYWORDS
Manganese

Thin films

Crystals

Sensors

Optical properties

X-rays

Solids

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