Gaussian beam Z-scan analysis for nonlinear optical materials possessing simultaneous third- and fifth-order nonlinear refraction with saturable absorption: an application to semiconductor CdSe quantum dot-polymer nanocomposites

Yasuo Tomita; Xiangming Liu; Yusuke Adachi

doi:10.1117/12.979824

18 December 2012 Gaussian beam Z-scan analysis for nonlinear optical materials possessing simultaneous third- and fifth-order nonlinear refraction with saturable absorption: an application to semiconductor CdSe quantum dot-polymer nanocomposites

Yasuo Tomita, Xiangming Liu, Yusuke Adachi

Author Affiliations +

Proceedings Volume 8550, Optical Systems Design 2012; 85503G (2012) https://doi.org/10.1117/12.979824
Event: SPIE Optical Systems Design, 2012, Barcelona, Spain

Abstract

We present a theoretical analysis of the closed-aperture Gaussian beam Z-scan for nonlinear optical materials with both saturable absorption and simultaneous third- and fifth-order nonlinear refraction. We formulate a theoretical expression for the Z-scan transmittance by means of the Adomian’s decomposition method and the thin film approximation. It is applied to the experimental characterization of the nonlinear optical properties of a semiconductor CdSe quantum dot-polymer nanocomposite film. We show that measured results of the open- and closed-aperture Z-scan transmittances of the nanocomposite film are well explained by the theoretical model.

Citation Download Citation

Yasuo Tomita, Xiangming Liu, and Yusuke Adachi "Gaussian beam Z-scan analysis for nonlinear optical materials possessing simultaneous third- and fifth-order nonlinear refraction with saturable absorption: an application to semiconductor CdSe quantum dot-polymer nanocomposites", Proc. SPIE 8550, Optical Systems Design 2012, 85503G (18 December 2012); https://doi.org/10.1117/12.979824

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