Paper
13 April 1988 Charge Coupled Devices Vs. Microchannel Plates In The Extreme And Far Ultraviolet : A Comparison Based On The Latest Laboratory Measurements.
J. Vallerga, M. Lampton
Author Affiliations +
Proceedings Volume 0868, Optoelectronic Technologies for Remote Sensing from Space; (1988) https://doi.org/10.1117/12.943596
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
Microchannel plates (MCPs) have been used as imaging photon counters successfully in the extreme and far ultraviolet (EUV and FUV) for many years. Charge Coupled Devices (CCDs), on the other hand, have become established for low light level sensing at visible and near infrared wavelengths (as well as X-ray). Recently, CCDs have been proposed as EUV and FUV detectors. With proper thinning and backside (input) surface treatments, the CCD quantum efficiency in the EUV and FUV is comparable and sometimes exceeds MCPs. A comparison of MCPs and CCDs for use in EUV and FUV low light level imaging is presented including: quantum efficiency, spatial resolution, format size, dynamic range and long term stability. The current best measured results for each detector type are reviewed as well as their own unique problems and limitations. The low light sensitivities in the ultraviolet achievable with optimized detector systems of each type are compared quantitatively for both for space-based astronomical and spectroscopic applications.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Vallerga and M. Lampton "Charge Coupled Devices Vs. Microchannel Plates In The Extreme And Far Ultraviolet : A Comparison Based On The Latest Laboratory Measurements.", Proc. SPIE 0868, Optoelectronic Technologies for Remote Sensing from Space, (13 April 1988); https://doi.org/10.1117/12.943596
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Sensors

Microchannel plates

Quantum efficiency

Extreme ultraviolet

Signal to noise ratio

CCD image sensors

RELATED CONTENT

DQE analysis for CCD imaging arrays
Proceedings of SPIE (May 02 1997)
Test Results On Intensified Charge Coupled Devices
Proceedings of SPIE (July 27 1976)
Photon counting arrays for AO wavefront sensors
Proceedings of SPIE (August 25 2005)
Cross delay line sensor characterization
Proceedings of SPIE (April 26 2010)

Back to Top