Paper
23 May 2013 Full field optical coherence microscopy for material testing: contrast enhancement and dynamic process monitoring
Bettina Heise, Stefan E. Schausberger, Boris Buchroithner, Michael Aigner, Ivana Milosavljevic, Peter Hierzenberger, Swanhild Bernstein, Sören Häuser, Alexander Jesacher, Stefan Bernet, Monika Ritsch-Marte, David Stifter
Author Affiliations +
Abstract
We illustrate the abilities of an advanced full-field optical coherence microscope (FF-OCM) setup for characterization of technical materials with internal micro-structures and present this technique also for dynamic process monitoring, as strain-stress tests. Additionally we briefly illustrate the potential of image processing in context of the chosen applications. Furthermore, contrast modification techniques based on Fourier plane filtering are discussed.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bettina Heise, Stefan E. Schausberger, Boris Buchroithner, Michael Aigner, Ivana Milosavljevic, Peter Hierzenberger, Swanhild Bernstein, Sören Häuser, Alexander Jesacher, Stefan Bernet, Monika Ritsch-Marte, and David Stifter "Full field optical coherence microscopy for material testing: contrast enhancement and dynamic process monitoring", Proc. SPIE 8792, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials, 87921A (23 May 2013); https://doi.org/10.1117/12.2020283
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Cited by 2 scholarly publications.
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KEYWORDS
Image processing

Reflectivity

Polymers

Image enhancement

Electronic filtering

Image filtering

Optical filters

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