Investigation of x-ray photon counting using a silicon-PIN diode and its application to energy-dispersive computed tomography

Hajime Kodama; Eiichi Sato; Michiaki Sagae; Osahiko Hagiwara; Hiroshi Matsukiyo; Akihiro Osawa; Toshiyuki Enomoto; Manabu Watanabe; Shinya Kusachi; Shigehiro Sato; Akira Ogawa

doi:10.1117/12.2025365

26 September 2013 Investigation of x-ray photon counting using a silicon-PIN diode and its application to energy-dispersive computed tomography

Hajime Kodama, Eiichi Sato, Michiaki Sagae, Osahiko Hagiwara, Hiroshi Matsukiyo, Akihiro Osawa, Toshiyuki Enomoto, Manabu Watanabe, Shinya Kusachi, Shigehiro Sato, Akira Ogawa

Author Affiliations +

Proceedings Volume 8853, Medical Applications of Radiation Detectors III; 885305 (2013) https://doi.org/10.1117/12.2025365
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

X-ray photon counting was performed using a readymade silicon-PIN photodiode (Si-PIN-PD) at tube voltages ranging from 42 to 60 kV, and X-ray photons are directly detected using the 100 MHz Si-PIN-PD without a scintillator. Photocurrent from the diode is amplified using charge-sensitive and shaping amplifiers. Using a multichannel analyzer, X-ray spectra at a tube voltage of 60 kV could easily be measured. The photon-counting computed tomography (PCCT) is accomplished by repeated linear scans and rotations of an object, and projection curves of the object are obtained by the linear scan. In the PC-CT, we confirmed the energy-dispersive effect with changes in lower-level voltage of the event pulse using a comparator.

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Hajime Kodama, Eiichi Sato, Michiaki Sagae, Osahiko Hagiwara, Hiroshi Matsukiyo, Akihiro Osawa, Toshiyuki Enomoto, Manabu Watanabe, Shinya Kusachi, Shigehiro Sato, and Akira Ogawa "Investigation of x-ray photon counting using a silicon-PIN diode and its application to energy-dispersive computed tomography", Proc. SPIE 8853, Medical Applications of Radiation Detectors III, 885305 (26 September 2013); https://doi.org/10.1117/12.2025365

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KEYWORDS

X-rays

Sensors

X-ray detectors

Photon counting

Amplifiers

Silicon

X-ray imaging

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