Paper
21 August 2013 The characteristic performance of an extreme ultraviolet MCP-based photon-counting imaging detector
Qiliang Ni, Kefei Song
Author Affiliations +
Proceedings Volume 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications; 89081Q (2013) https://doi.org/10.1117/12.2034459
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
A new prototype of two-dimensional photon-counting imaging detector with a bare microchannel plate (MCP) stack and induced charge wedge-strip anode in extreme ultraviolet (EUV) region has been developed, which will be applied to a moon-based EUV camera. The detector mainly is composed of a MCP stack operating in pulse-counting mode, induced charge wedge-strip anode (WSA) and correlative analog and data processing circuit. A three electrode wedge-strip position-sensitive anode with 1.5 mm period and 48 mm diameter active area was fabricated by picosecond laser processing technology, and front-end analog and data circuit with maximum rate 300kHz also been developed. Operating characteristics of the prototype of MCP detector including background rate, pulse height distribution, gain, image linearity and spatial resolution were measured. The measured results show that the spatial resolution can arrive at 5linepair/mm, this responds to 0.2 mm, background rate is less than 1counts/cm2•s. These specifications can completely satisfy the requirement of moon-based EUV camera on the spatial resolution and background rate.
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Qiliang Ni and Kefei Song "The characteristic performance of an extreme ultraviolet MCP-based photon-counting imaging detector", Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89081Q (21 August 2013); https://doi.org/10.1117/12.2034459
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KEYWORDS
Sensors

Microchannel plates

Extreme ultraviolet

Spatial resolution

Electrodes

Image sensors

Cameras

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