Paper
10 October 2013 Research status and developing trends of grating nanometer measuring technology
Minlan Jiang, Huifeng Li, Xiaodong Wang, Jianguo Shen
Author Affiliations +
Proceedings Volume 8916, Sixth International Symposium on Precision Mechanical Measurements; 891631 (2013) https://doi.org/10.1117/12.2035685
Event: Sixth International Symposium on Precision Mechanical Measurements, 2013, Guiyang, China
Abstract
Along with the progress of rating and signal processing technology, because of its advantages and wide application, grating measuring technology has become a research hotspot in the precision measuring field. Nanometer measuring has become urgently to solve problem with the need of industrial development and scientific research from sub micrometer to nanometer precision measurement. This paper systematically discusses its research status, existing problems, developing trends and other issues about grating nanometer measuring technology. It provides references to grating nanometer measuring technology researches and its development.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Minlan Jiang, Huifeng Li, Xiaodong Wang, and Jianguo Shen "Research status and developing trends of grating nanometer measuring technology", Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 891631 (10 October 2013); https://doi.org/10.1117/12.2035685
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KEYWORDS
Diffraction gratings

Interferometers

Nanotechnology

Precision measurement

Computer programming

Manufacturing

Diffraction

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