Paper
19 December 2013 Wavelet basis spectrum recovery for nonuniformly sampled interferogram
Author Affiliations +
Proceedings Volume 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 90450S (2013) https://doi.org/10.1117/12.2037673
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
Interferogram obtained by Temporally-Spatially Modulated Fourier Transform Spectrometers should be recovered to spectrum by fast Fourier transform method (FFT). However, the interferogram sometimes is nonuniformly sampled, which cannot use FFT directly. In this paper, we propose a wavelet basis fitting method to interpolate the interferogram onto an equal-spaced grid. Hence, we can utilize FFT to recover spectrum. The simulated result of the recovered spectrum indicates that the proposed interferogram wavelet basis fitting method can interpolate the nonuniformly sampled interferogram effectively. The preliminary results show that this method introduces less errors than the Polynomial fitting method does.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoming Ding, Yan Yuan, Lijuan Su, and Fengzhen Huang "Wavelet basis spectrum recovery for nonuniformly sampled interferogram", Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450S (19 December 2013); https://doi.org/10.1117/12.2037673
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavelets

Fourier transforms

Spectrometers

Error analysis

Discrete wavelet transforms

Modulation

Environmental sensing

RELATED CONTENT


Back to Top