Paper
5 September 2014 Flux monitoring by x-ray diffracting crystals under ambient air conditions
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Abstract
An electrical response of a diffracting diamond (111) crystal was studied in a single electrode configuration where the electrode was deposited on a small portion of the crystal entrance surface. The experiment was performed in ambient air using an x-ray beam after a Si (111) double-crystal monochromator with the diamond crystal set in the Bragg diffraction condition. It was found that the electric current as a function of the Bragg angle exhibits behavior characteristic of secondary yield curves (e.g.,1). It is proposed to utilize this effect to monitor the intensity of the Bragg reflected x-ray beam. Such non-invasive monitoring does not rely on the use of stand-alone radiation monitors (e.g., ionization chambers) and is expected to facilitate x-ray optics alignment procedures. As an attempt to improve signal-to-noise ratio by containing the electric field in the optical element an electric response of a high-resistivity silicon crystal was studied in a two-electrode configuration. Preliminary results are reported.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stanislav Stoupin, Sergey V. Baryshev, and Sergey P. Antipov "Flux monitoring by x-ray diffracting crystals under ambient air conditions", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070B (5 September 2014); https://doi.org/10.1117/12.2062495
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Crystals

X-rays

Diamond

Electrodes

Silicon

Optical components

X-ray optics

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