Paper
4 March 2015 Optimisation of fundamental transverse mode output in electrically pumped vertical external cavity surface emitting lasers
Xiao Jin, Pavlo Ivanov, David T. D. Childs, Nasser Babazadeh, John Orchard, Benjamin J. Stevens, Richard A. Hogg
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Abstract
In this work we report on the simulation of electrically pumped vertical external cavity surface emitting lasers (EP-VECSELs). We simulate an etched mesa structure (substrate emission) with the substrate acting as the current spreading layer. The effect of contact misalignment on the carrier distribution within the active element is explored and confirms the validity of the model in describing the carrier distribution. We go on to discuss the effects of the substrate thickness and trench depth on the intensity profile. Simulation results show that a thicker substrate and a trench partially etched into the substrate may improve the intensity profile in future devices.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiao Jin, Pavlo Ivanov, David T. D. Childs, Nasser Babazadeh, John Orchard, Benjamin J. Stevens, and Richard A. Hogg "Optimisation of fundamental transverse mode output in electrically pumped vertical external cavity surface emitting lasers", Proc. SPIE 9349, Vertical External Cavity Surface Emitting Lasers (VECSELs) V, 93490T (4 March 2015); https://doi.org/10.1117/12.2078945
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KEYWORDS
Electroluminescence

Instrument modeling

Resistance

Vertical external cavity surface emitting lasers

Modeling

Metals

Etching

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