Paper
27 February 2015 Strain tuning of germanium bandgap by selective epitaxial growth for electro-absorption modulators
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Proceedings Volume 9367, Silicon Photonics X; 93670E (2015) https://doi.org/10.1117/12.2080449
Event: SPIE OPTO, 2015, San Francisco, California, United States
Abstract
The bandgap tuning of sub-micron wide Germanium (Ge) waveguides by selective epitaxial growth (SEG) method with a SiO2 mask has been demonstrated. SEG-grown Ge waveguides on Si substrate are designed to show various compressive strain depending on the growth parameters, such as the width and thickness of Ge waveguides and SiO2 masks. X-Ray Diffraction (XRD) verifies that -0.25% (compressive) strain is induced in a 0.6μm-wide Ge waveguide with SiO2 mask of 20μm width and 1.0μm thickness. The strained Ge waveguide should show the absorption edge wavelength of ~1.55μm. Furthermore, compressive strain can be tuned between -0.03% and -0.25% by changing the lateral structure of the device, which correspond to the absorption edge wavelength of 1.548~1.568μm. It means that only one epitaxial growth with specific lateral design of the electro-absorption modulator can modulate light in the wavelength range.
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Y. Mizuno, M. Yako, N. M. Luan, and K. Wada "Strain tuning of germanium bandgap by selective epitaxial growth for electro-absorption modulators", Proc. SPIE 9367, Silicon Photonics X, 93670E (27 February 2015); https://doi.org/10.1117/12.2080449
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KEYWORDS
Germanium

Silica

Waveguides

Silicon

Modulators

Photomasks

Absorption

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