A low-noise wide-dynamic-range event-driven detector using SOI pixel technology for high-energy particle imaging

Sumeet Shrestha; Hiroki Kamehama; Shoji Kawahito; Keita Yasutomi; Keiichiro Kagawa; Ayaki Takeda; Takeshi Go Tsuru; Yasuo Arai

doi:10.1117/12.2188019

26 August 2015 A low-noise wide-dynamic-range event-driven detector using SOI pixel technology for high-energy particle imaging

Sumeet Shrestha, Hiroki Kamehama, Shoji Kawahito, Keita Yasutomi, Keiichiro Kagawa, Ayaki Takeda, Takeshi Go Tsuru, Yasuo Arai

Author Affiliations +

Proceedings Volume 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII; 95930X (2015) https://doi.org/10.1117/12.2188019
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

This paper presents a low-noise wide-dynamic-range pixel design for a high-energy particle detector in astronomical applications. A silicon on insulator (SOI) based detector is used for the detection of wide energy range of high energy particles (mainly for X-ray). The sensor has a thin layer of SOI CMOS readout circuitry and a thick layer of high-resistivity detector vertically stacked in a single chip. Pixel circuits are divided into two parts; signal sensing circuit and event detection circuit. The event detection circuit consisting of a comparator and logic circuits which detect the incidence of high energy particle categorizes the incident photon it into two energy groups using an appropriate energy threshold and generate a two-bit code for an event and energy level. The code for energy level is then used for selection of the gain of the in-pixel amplifier for the detected signal, providing a function of high-dynamic-range signal measurement. The two-bit code for the event and energy level is scanned in the event scanning block and the signals from the hit pixels only are read out. The variable-gain in-pixel amplifier uses a continuous integrator and integration-time control for the variable gain. The proposed design allows the small signal detection and wide dynamic range due to the adaptive gain technique and capability of correlated double sampling (CDS) technique of kTC noise canceling of the charge detector.

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Sumeet Shrestha, Hiroki Kamehama, Shoji Kawahito, Keita Yasutomi, Keiichiro Kagawa, Ayaki Takeda, Takeshi Go Tsuru, and Yasuo Arai "A low-noise wide-dynamic-range event-driven detector using SOI pixel technology for high-energy particle imaging", Proc. SPIE 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII, 95930X (26 August 2015); https://doi.org/10.1117/12.2188019

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KEYWORDS

Sensors

Signal detection

CMOS sensors

Particles

X-rays

X-ray detectors

Transistors

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