Birefringence measurement of glass ion-exchanged waveguides: burying depth or cover layer influence

D. Jamon; J. P. Garayt; E. Jordan; F. Parsy; E. Ghibaudo; S. Neveu; J.-E. Broquin; F. Royer

doi:10.1117/12.2209273

1 March 2016 Birefringence measurement of glass ion-exchanged waveguides: burying depth or cover layer influence

D. Jamon, J. P. Garayt, E. Jordan, F. Parsy, E. Ghibaudo, S. Neveu, J.-E. Broquin, F. Royer

Proceedings Volume 9750, Integrated Optics: Devices, Materials, and Technologies XX; 97500B (2016) https://doi.org/10.1117/12.2209273
Event: SPIE OPTO, 2016, San Francisco, California, United States

Abstract

This paper deals with an experimental non-destructive technique for the measurement of polarization behavior of integrated optical waveguides. It is based on a high resolution polarimeter associated to an ellipsometric-type calibration which allows determining the full state of polarization of the output light. A magneto-optic perturbation is also added to generate TE/TM mode beating, whose spatial period is directly linked to the modal TE/TM birefringence. This equipment is first qualified by the measurement of modal birefringence in totally or partially buried ion exchanged waveguides. The results show that the value of the birefringence varies as a function of the diffusion aperture width or with the burying depth. By adding a magneto-optical cover layer, consisting in magnetic nanoparticles doped silica matrix obtained by a sol gel process ¹, we evidence a huge increase of the beating magnitude and a decrease of the modal birefringence.

Citation Download Citation

D. Jamon, J. P. Garayt, E. Jordan, F. Parsy, E. Ghibaudo, S. Neveu, J.-E. Broquin, and F. Royer "Birefringence measurement of glass ion-exchanged waveguides: burying depth or cover layer influence", Proc. SPIE 9750, Integrated Optics: Devices, Materials, and Technologies XX, 97500B (1 March 2016); https://doi.org/10.1117/12.2209273

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