A generic optical metrology platform for AR/VR

Will Zhou; Jiang He; Pengfei Wu; Wei Wang; Nathan Yang; Tang Song

doi:10.1117/12.2614074

5 March 2022 A generic optical metrology platform for AR/VR

Will Zhou, Jiang He, Pengfei Wu, Wei Wang, Nathan Yang, Tang Song

Proceedings Volume PC12008, Photonic Instrumentation Engineering IX; PC1200805 (2022) https://doi.org/10.1117/12.2614074
Event: SPIE OPTO, 2022, San Francisco, California, United States

Abstract

Optical metrology provides direct feedback for AR/VR/MR design verification and manufacturability evaluation by imitating the human eye’s optical properties of resolution, color sensitivity and uniformity over large FOVs, self-adaption to focus location, brightness and contrast. This paper defines a generic, standardized optical metrology platform to efficiently integrate various optical metrology instruments into the platform’s global coordinate system by utilizing a specially designed active-optical calibration target to precisely map the optical entrance pupil of any optical metrology instrument and device under test (DUT) to a common reference point, providing effective data correlation. The platform can easily accommodate common AR/VR/MR optical metrology equipment for measurements of: MTF/contrast, color and brightness, virtual distance, angular FOV, and binocular alignment error; to provide a unified metrology platform for optical measurements.

Conference Presentation

Citation Download Citation

Will Zhou, Jiang He, Pengfei Wu, Wei Wang, Nathan Yang, and Tang Song "A generic optical metrology platform for AR/VR", Proc. SPIE PC12008, Photonic Instrumentation Engineering IX, PC1200805 (5 March 2022); https://doi.org/10.1117/12.2614074

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