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9 March 2022 Force detection of electromagnetic beam chirality at the nanoscale
Abid Anjum Sifat, Filippo Capolino, Eric Potma
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Proceedings Volume PC12017, Complex Light and Optical Forces XVI; PC120170T (2022) https://doi.org/10.1117/12.2626327
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
The chirality of electromagnetic beams is a property relevant to various nanophotonic applications, yet this property is challenging to characterize at the nanoscale. We have found that electromagnetic beam chirality can be probed through the optical force exerted on a cantilevered, chiral tip. We demonstrate that the differential force, i.e. the difference in the force induced by a focused beam and an auxiliary beam of opposite handedness, exhibits a direct correspondence to the beam’s time-averaged helicity density. Measurement of the differential force yields spatially resolved maps of the helicity density of tightly focused beams with sub-diffraction limited resolution.
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Abid Anjum Sifat, Filippo Capolino, and Eric Potma "Force detection of electromagnetic beam chirality at the nanoscale", Proc. SPIE PC12017, Complex Light and Optical Forces XVI, PC120170T (9 March 2022); https://doi.org/10.1117/12.2626327
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KEYWORDS
Electromagnetism
Nanophotonics
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