Shadow artiface removal technology based on multi-light sheet illumination fluorescence microscopy

Inkeon Ryu; Junyoung Shin; Daekeun Kim

doi:10.1117/12.2650867

17 March 2023 Shadow artiface removal technology based on multi-light sheet illumination fluorescence microscopy

Inkeon Ryu, Junyoung Shin, Daekeun Kim

Proceedings Volume PC12385, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX; PC123850Q (2023) https://doi.org/10.1117/12.2650867
Event: SPIE BiOS, 2023, San Francisco, California, United States

Conference Poster

Abstract

This conference presentation was prepared for the Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX conference at SPIE BiOS, 2023.

Citation Download Citation

Inkeon Ryu, Junyoung Shin, and Daekeun Kim "Shadow artiface removal technology based on multi-light sheet illumination fluorescence microscopy", Proc. SPIE PC12385, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX, PC123850Q (17 March 2023); https://doi.org/10.1117/12.2650867

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