Single-shot ptychography at free-electron lasers for imaging and beam characterization (Conference Presentation)

Konstantin Kharitonov; Mabel Ruiz-Lopez; Barbara Keitel; Elke Plönjes; Alessandro Marras; Jonathan Correa; Cornelia Wunderer

doi:10.1117/12.2669094

9 June 2023 Single-shot ptychography at free-electron lasers for imaging and beam characterization (Conference Presentation)

Konstantin Kharitonov, Mabel Ruiz-Lopez, Barbara Keitel, Elke Plönjes, Alessandro Marras, Jonathan Correa, Cornelia Wunderer

Author Affiliations +

Proceedings Volume PC12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; PC1258107 (2023) https://doi.org/10.1117/12.2669094
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

Ptychography is a scanning coherent diffraction imaging technique capable of simultaneous imaging of extended samples and beam characterization with diffraction-limited resolution. However, the scanning mode of data acquisition nature makes ptychography time-consuming and prevents its application for imaging of dynamical processes or single-shot beam characterization required at free-electron lasers. It is possible to perform ptychography in the single-shot mode by collecting the diffraction patterns of multiple overlapping beams in one shot, thus measuring the whole dataset at once and removing the need for scanning. A setup realizing this principle was proposed for visible light[1] however, it cannot be straightforwardly applied to X-ray due to the use of refractive optics. We present a novel single-shot ptychography setup based on a combination of X-ray focusing optics and beam-splitting grating, and a corresponding forward model that facilitates single-shot imaging of extended samples at soft X-ray wavelengths. The setup was tested during the proof of concept experiment at the free-electron laser FLASH at DESY and allowed us to obtain a reconstruction of a test sample and probe wavefield from the data measured with a single pulse of FLASH. This technique, further improved and adapted for harder X-ray, will allow the high-resolution single-shot imaging of extended dynamical samples as well as the single-shot beam characterization at X-ray free-electron lasers. [1] Sidorenko, Pavel, and Oren Cohen. "Single-shot ptychography." Optica 3.1 (2016): 9-14.

Conference Presentation

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Konstantin Kharitonov, Mabel Ruiz-Lopez, Barbara Keitel, Elke Plönjes, Alessandro Marras, Jonathan Correa, and Cornelia Wunderer "Single-shot ptychography at free-electron lasers for imaging and beam characterization (Conference Presentation)", Proc. SPIE PC12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC1258107 (9 June 2023); https://doi.org/10.1117/12.2669094

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KEYWORDS

Free electron lasers

X-rays

X-ray imaging

X-ray optics

X-ray characterization

Image processing

Image resolution

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