Presentation
13 March 2024 Dual wavelength Hong-Ou-Mandel imaging
Ashley Lyons, Khaled Kassem, Daniele Faccio, Jack Radford
Author Affiliations +
Proceedings Volume PC12852, Quantitative Phase Imaging X; PC1285201 (2024) https://doi.org/10.1117/12.3009777
Event: SPIE BiOS, 2024, San Francisco, California, United States
Abstract
Hong-Ou-Mandel (HOM) interferometry, manifesting as photon bunching at a beamsplitter, can provide high precision optical path length sensing yet is robust to phase noise and immune to phase-wrapping. In this work we demonstrate how the sensitivity of HOM based imaging can be enhanced using dual wavelength illumination whilst maintaining its high level of robustness. We observe a beating in the second order correlation function due to the interference between the two wavelengths bands with a periodicity determined by the wavelength separation. These small-scale features can be used to precisely determine optical path length at the nanometre scale whilst a coarse (micron scale) estimation can be obtained by measuring only one of the bands.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashley Lyons, Khaled Kassem, Daniele Faccio, and Jack Radford "Dual wavelength Hong-Ou-Mandel imaging", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC1285201 (13 March 2024); https://doi.org/10.1117/12.3009777
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KEYWORDS
Beam path

Precision optics

Interferometry

Light sources and illumination

Microscopy

Optical filters

Optical sensing

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