Presentation
13 March 2024 3D quantitative phase imaging at the atomic scale based on electron tomography
Yongsoo Yang
Author Affiliations +
Proceedings Volume PC12852, Quantitative Phase Imaging X; PC1285202 (2024) https://doi.org/10.1117/12.3000113
Event: SPIE BiOS, 2024, San Francisco, California, United States
Abstract
Modern science and technology rely on functional materials, and the physical properties of these materials often strongly depend on defects, local disorder, nanoscale heterogeneities, and grain structures at the atomic scale. Atomic electron tomography (AET) is now able to locate the 3D coordinates of individual atoms and their dynamics with picometer precision and elemental specificity. However, the majority of AET results have been based on incoherent imaging methods, which limit the application of AET for radiation-sensitive materials and light chemical elements. In this talk, I will briefly discuss the current capability of AET and introduce ideas based on quantitative phase imaging to enhance dose efficiencies and enable the detection of light elements [1]. [1]. J. Lee et al., Phys. Rev. Applied 19, 054062 (2023).
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongsoo Yang "3D quantitative phase imaging at the atomic scale based on electron tomography", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC1285202 (13 March 2024); https://doi.org/10.1117/12.3000113
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KEYWORDS
Electron tomography

Phase imaging

3D image processing

Chemical elements

Chemical species

Crystallography

Diseases and disorders

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