Presentation
13 March 2024 Quantitative phase imaging of single particles from cryo-EM micrographs
Author Affiliations +
Proceedings Volume PC12852, Quantitative Phase Imaging X; PC1285206 (2024) https://doi.org/10.1117/12.3008498
Event: SPIE BiOS, 2024, San Francisco, California, United States
Abstract
Single particle imaging in cryoelectron microscopy (cryo-EM) is a challenging problem due low SNR micrograph data. The standard image processing chain requires extensive averaging of large number of “similar” particle images. A cryo-EM micrograph is an in-line hologram recorded with coherent electron beam where the typical macro-molecules behave as weak phase objects. We show that optical in-line holography methods for auto-focusing can be applied to cryo-EM data to get improved per-particle defocus estimates after including the effect of spherical aberration. Further a sparse iterative algorithm can provide quantitative phase information about single particles leading to a potentially new processing path.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kedar Khare, Muskan Kularia, and Manidipa Banerjee "Quantitative phase imaging of single particles from cryo-EM micrographs", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC1285206 (13 March 2024); https://doi.org/10.1117/12.3008498
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KEYWORDS
Photomicroscopy

Particles

Phase imaging

Monochromatic aberrations

Data modeling

Electron beams

Image processing

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