Microelectromechanical system switching isolation amplifier for low frequency measurement

Miao Lu; Zhengping Zhao; Xiaodong Hu; Xuefeng Zou; Hejun Guo

doi:10.1117/1.1758950

1 July 2004 Microelectromechanical system switching isolation amplifier for low frequency measurement

Miao Lu, Zhengping Zhao, Xiaodong Hu, Xuefeng Zou, Hejun Guo

Author Affiliations +

Journal of Micro/Nanolithography, MEMS, and MOEMS, Vol. 3, Issue 3, (July 2004). https://doi.org/10.1117/1.1758950

Abstract

A microelectromechanical systems (MEMS) isolation amplifier is presented, which uses MEMS switches to realize a "flying capacitor" structure. This isolation amplifier has the advantages of simple circuit structures, smaller dimensions, low cost, excellent electromagnetic compatibility (EMC) performance, easy to make multichannel isolation circuits, integration compatibility with on-chip electronics, etc. The performance of the MEMS switch exhibits 30-V pull-in voltage, 35-μs time delay, and 110-V breakdown voltage. The preliminary performance of the isolation amplifier is also demonstrated. To our knowledge, this work presents the first MEMS isolation amplifier structure.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Miao Lu, Zhengping Zhao, Xiaodong Hu, Xuefeng Zou, and Hejun Guo "Microelectromechanical system switching isolation amplifier for low frequency measurement," Journal of Micro/Nanolithography, MEMS, and MOEMS 3(3), (1 July 2004). https://doi.org/10.1117/1.1758950

Published: 1 July 2004

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