Analysis of compatibility between lighting devices and descriptive features using Parzen's Kernel: application to flaw inspection by artifical vision

Pierre Geveaux; Sophie Kohler; Johel Miteran; Frederic Truchetet

doi:10.1117/1.1323676

1 December 2000 Analysis of compatibility between lighting devices and descriptive features using Parzen's Kernel: application to flaw inspection by artifical vision

Pierre Geveaux, Sophie Kohler, Johel Miteran, Frederic Truchetet

Author Affiliations +

Optical Engineering, Vol. 39, Issue 12, (December 2000). https://doi.org/10.1117/1.1323676

We present a supervised method, developed for industrial inspections by artificial vision, to obtain an adapted combination of descriptive features and a lighting device. This method must be implemented under real-time constraints and therefore a minimal number of features must be selected. The method is based on the assessment of the discrimination power of many descriptive features. The objective is to select the combination of descriptive features and lighting system best able to discriminate flawed classes from defect-free classes. In the first step, probability densities are computed for flawed and defect-free classes and for each tested combination. The discrimination power of the features can be measured using the computed probability of error. In the second step, we obtain a combination that gives a low probability of errors. This leads us to choose each feature individually and then build a multidimensional decision space. A concrete application of this method is presented on an industrial problem of flaw detection by artificial vision. The results are compared with those given by classical multiple discriminant analysis (MDA) to justify the use of our method.

Citation Download Citation

Pierre Geveaux, Sophie Kohler, Johel Miteran, and Frederic Truchetet "Analysis of compatibility between lighting devices and descriptive features using Parzen's Kernel: application to flaw inspection by artifical vision," Optical Engineering 39(12), (1 December 2000). https://doi.org/10.1117/1.1323676

Published: 1 December 2000

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available