Jarkko Telkkälä
Product Line Manager
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 4 March 2019 Paper
Jürgen Müller, Rainer Bättig, Vinzenz Beer, Christian Blumer, Reinhard Brunner, Jarkko Telkkälä, Johanna Wolf
Proceedings Volume 10900, 109000C (2019) https://doi.org/10.1117/12.2509604
KEYWORDS: Epitaxy, High power lasers, Reliability, Laser development, Metalorganic chemical vapor deposition, Laser applications, Yield improvement, Manufacturing, Laser systems engineering

Proceedings Article | 7 March 2014 Paper
Proceedings Volume 8965, 896510 (2014) https://doi.org/10.1117/12.2037771
KEYWORDS: Indium, High power lasers, Diodes, Surgery, Reliability, Laser development, Measurement devices, Laser applications, Resistance, Continuous wave operation

Proceedings Article | 17 February 2011 Paper
M. Dumitrescu, J. Telkkälä, J. Karinen, J. Viheriälä, A. Laakso, K. Haring, M.-R. Viljanen, J. Paajaste, R. Koskinen, S. Suomalainen, J. Lyytikäinen, T. Leinonen, M. Pessa
Proceedings Volume 7953, 79530B (2011) https://doi.org/10.1117/12.875317
KEYWORDS: Laser development, Refractive index, Mirrors, Etching, Nanoimprint lithography, Laser damage threshold, Laser applications, LIDAR, Reflectivity, Fabrication

Proceedings Article | 17 February 2011 Paper
M. Dumitrescu, J. Telkkälä, J. Karinen, J. Viheriälä, A. Laakso, S. Afzal, J.-P. Reithmaier, M. Kamp, P. Melanen, P. Uusimaa, P. Bardella, M. Vallone, I. Montrosset, O. Parillaud, M. Krakowski, D. Gready, G. Eisenstein, G. Sek
Proceedings Volume 7953, 79530D (2011) https://doi.org/10.1117/12.875674
KEYWORDS: Modulation, Refractive index, Scanning electron microscopy, Etching, Distributed Bragg reflectors, Laser development, Phase shift keying, Resistance, Waveguides, Cladding

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