Paper
22 November 1986 THM single crystal CMT material
A Durand, J L Dessus, T Nguyen Duy, J F Barbot
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Proceedings Volume 0659, Materials Technologies for Infrared Detectors; (1986) https://doi.org/10.1117/12.938549
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
The intrinsic semiconductor alloy system Cdx Hgl-x Te is an important material for I.R detection. By changing the alloy composition x, the energy gap of Cdx Te can be varied and may be optimized for various wavelengths through the I.R spectrum. The most important wavelength ranges are the atmospheric windows 8-12 μ (x≈ 0,2) and 3-5 μ (x≈ 0,3) for thermal imaging and the 1,3-2,5 μ range (x ≈0,5 to 0,7) for optical fiber applications.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A Durand, J L Dessus, T Nguyen Duy, and J F Barbot "THM single crystal CMT material", Proc. SPIE 0659, Materials Technologies for Infrared Detectors, (22 November 1986); https://doi.org/10.1117/12.938549
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Cited by 11 scholarly publications.
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KEYWORDS
Crystals

Tellurium

Cadmium

Mercury

Semiconducting wafers

Thermography

Cartography

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