A scanning approach using a binary grid pattern for 3D shape measurements

Nai-Jen Cheng; Wei-Hung Su

doi:10.1117/12.2275327

23 August 2017 A scanning approach using a binary grid pattern for 3D shape measurements

Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI; 103820N (2017) https://doi.org/10.1117/12.2275327
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

A scanning pattern projection technique for 3D shape measurements is proposed. A binary grid pattern is employed as the projected pattern. The limited depth-of-focus of the pattern projection system makes the surface on the focused area can be clearly observed. Thus, a 2D contour of the inspected surface addressed by the in-focused fringes was obtained. By assembling the surface contours with their corresponding depths, the 3D shape of the object cab retrieved.

Conference Presentation

Citation Download Citation

Nai-Jen Cheng and Wei-Hung Su "A scanning approach using a binary grid pattern for 3D shape measurements", Proc. SPIE 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI, 103820N (23 August 2017); https://doi.org/10.1117/12.2275327

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