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21 November 2017 Novel technologies for space x-ray optics
R. Hudec, L. Pína, V. Semencova, A. Inneman, M. Skulinova, L. Sveda, M. Míka, R. Kacerovsky, J. Prokop, V. Brozek, J. Sik
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Proceedings Volume 10567, International Conference on Space Optics — ICSO 2006; 105673L (2017) https://doi.org/10.1117/12.2308125
Event: International Conference on Space Optics 2006, 2006, Noordwijk, Netherlands
Abstract
The future space X-ray astronomy imaging missions require very large collecting areas at still fine angular resolution and reasonable weight. The novel space Xray optics substrates such as Silicon wafers and thin thermally formed glass enable wide applications of precise and very light weight (volume densities 2.3 to 2.5 gcm-3) optics. The recent status of novel technologies as well as developed test samples with emphasis on precise optical surfaces based on novel materials and their space applications will be presented and discussed.
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R. Hudec, L. Pína, V. Semencova, A. Inneman, M. Skulinova, L. Sveda, M. Míka, R. Kacerovsky, J. Prokop, V. Brozek, and J. Sik "Novel technologies for space x-ray optics", Proc. SPIE 10567, International Conference on Space Optics — ICSO 2006, 105673L (21 November 2017); https://doi.org/10.1117/12.2308125
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KEYWORDS
Semiconducting wafers
Silicon
Glasses
X-ray optics
Wafer-level optics
X-ray telescopes
Astronomical imaging
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