Paper
24 May 2018 Assessing microlens quality based on 3D irradiance measurement at the focal spot area
Author Affiliations +
Abstract
During the fabrication process of microlenses, characterization is essential for two purposes: evaluate the optical quality of the element and provide surface information feedback for process optimization. However, no technique can fulfill these two objectives at the same time. Interferometry is used for quality evaluation and optical profilometry for process optimization. In order to address this problem, we propose to use a high resolution interference microscope to characterize microlenses. The focusing capacity can be directly measured by recording the field near the focal spot at different wavelengths. Information about the microlens surface can also be retrieved. All this is illustrated for the front focus of a fused-silica microlens.
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Jeremy Béguelin, Michail Symeonidis, Wilfried Noell, Reinhard Voelkel, and Toralf Scharf "Assessing microlens quality based on 3D irradiance measurement at the focal spot area", Proc. SPIE 10678, Optical Micro- and Nanometrology VII, 106780B (24 May 2018); https://doi.org/10.1117/12.2306136
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KEYWORDS
Microlens

Interferometry

Microscopes

Confocal microscopy

Wavefronts

Objectives

Optical components

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