Paper
17 May 2018 Exploiting silicon oxycarbides for integrated photonic applications
Faisal Ahmed Memon, Francesco Morichetti, Andrea Melloni
Author Affiliations +
Abstract
We report on the characteristics of silicon oxycarbide films deposited by reactive radio frequency magnetron sputtering of a silicon carbide target in the presence of argon and oxygen gases. Quantitative characterization of the silicon oxycarbide films is performed extensively by ellipsometry, scanning electron microscopy and atomic force microscopy. Integrated photonic waveguides are demonstrated in silicon oxycarbide films.
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Faisal Ahmed Memon, Francesco Morichetti, and Andrea Melloni "Exploiting silicon oxycarbides for integrated photonic applications", Proc. SPIE 10683, Fiber Lasers and Glass Photonics: Materials through Applications, 106832T (17 May 2018); https://doi.org/10.1117/12.2306624
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KEYWORDS
Waveguides

Refractive index

Silicon

Integrated photonics

Atomic force microscopy

Scanning electron microscopy

Sputter deposition

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