Automatic quality and ripeness inspection system

Jing Fang; Rudolf L. van Renesse

doi:10.1117/12.20248

1 August 1990 Automatic quality and ripeness inspection system

Jing Fang, Rudolf L. van Renesse

Proceedings Volume 1265, Industrial Inspection II; (1990) https://doi.org/10.1117/12.20248
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

The feasibility of an opto-electronic inspection system for the sorting and grading of apples with respect to ripeness and quality is studied. This study comprises a detailed spectral analysis of the healthy skin as well as a variety of visual defects. Three different apple species were studied: Cox orange, Golden delicious and Golden rennet. Spectral wavebands of interest appear to be the chlorophyll peak around 570nm, the ripeness peak around 64Onrrt and the near infra-red beyond 75Onxn. Stem and calix of apples pose a separate problem because their spectral reflection cannot be distinguished from that of most visual defects. A solution for this problem is given.

Citation Download Citation

Jing Fang and Rudolf L. van Renesse "Automatic quality and ripeness inspection system", Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); https://doi.org/10.1117/12.20248

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