New approach to the study of microchannel-plate-sensitive surface

Michael A. Gruntman

doi:10.1117/12.23281

1 November 1990 New approach to the study of microchannel-plate-sensitive surface

Michael A. Gruntman

Proceedings Volume 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy; (1990) https://doi.org/10.1117/12.23281
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A new approach to study the composition of microchannel plate sensitive surface by secondary ion mass spectrometry is described. The time-of-flight technique is implemented in an unconventional way which permits using the continuous probing beam and concurrent multichannel mass identification. This makes the technique relatively simple, and the low doses and low probing beam intensities provide the opportunity to perform nondestructive analysis of thin layers and fragile films.

Citation Download Citation

Michael A. Gruntman "New approach to the study of microchannel-plate-sensitive surface", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23281

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