Precision evaluation of lens systems using a nodal slide/MTF optical bench

Victor J. Doherty D.V.M.; Philip D. Chapnik

doi:10.1117/12.134851

1 January 1992 Precision evaluation of lens systems using a nodal slide/MTF optical bench

Victor J. Doherty D.V.M., Philip D. Chapnik

Proceedings Volume 1531, Advanced Optical Manufacturing and Testing II; (1992) https://doi.org/10.1117/12.134851
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

A compact, self-contained production instrument designed to permit the rapid and precise performance characterization of a wide variety of lenses and optical systems has been developed by Eidolon Corporation. The Eidolon Production Nodal Slide/MTF Measurement System can be used to measure effective focal length (EFL), distortion, field curvature, chromatic aberration, spot size, and modulation transfer function (MTF).

Citation Download Citation

Victor J. Doherty D.V.M. and Philip D. Chapnik "Precision evaluation of lens systems using a nodal slide/MTF optical bench", Proc. SPIE 1531, Advanced Optical Manufacturing and Testing II, (1 January 1992); https://doi.org/10.1117/12.134851

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