Paper
25 November 1992 Preparation and properties of manganese dioxide thin films for applications in selective surface
A. K. Mallick, M. Khairul Al Khan
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Abstract
MnO2 thin films have been prepared by thermal evaporation technique onto glass substrate at varying deposition pressure. Electrical studies of the films deposited at about 1.5 X 10-5 Torr show a positive TCR indicating metallic characteristics, whereas a negative TCR indicating semiconducting behavior exhibit on the films deposited at a pressure of about 3.0 X 10-6 Torr. Thickness dependent electrical conductivity, activation energy, and aging effect were also carried out. Optical measurements in the wavelength range 0.3 < (lambda) < 2.5 micrometers show the films highly transparent in the visible. These studies may be of importance for the application of this material in surface coating for energy efficient devices.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. K. Mallick and M. Khairul Al Khan "Preparation and properties of manganese dioxide thin films for applications in selective surface", Proc. SPIE 1727, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XI: Selective Materials, Concentrators and Reflectors, Transparent Insulation and Superwindows, (25 November 1992); https://doi.org/10.1117/12.130525
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KEYWORDS
Manganese

Thin films

Glasses

Reflectivity

Coating

Semiconductors

Temperature metrology

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