Development of an automatic spectrophotometer

Peiyun Wu; Peifu Gu; Xu Liu; Jinfa Tang

doi:10.1117/12.168212

1 February 1994 Development of an automatic spectrophotometer

Peiyun Wu, Peifu Gu, Xu Liu, Jinfa Tang

Proceedings Volume 1994, Advanced Optical Manufacturing and Testing IV; (1994) https://doi.org/10.1117/12.168212
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

An automatic spectrophotometer has been developed for spectral measurements of transmittance, reflectance and total optical losses of thin film specimens. The general system design and automation is described. The measured results of narrowband filters, ZnS films, mirrors, etc., are presented. In the visible region, the overall photometric accuracy is verified to be 0.1% and 0.2% for transmittance and reflectance; respectively. The wavelength scale is accurate to within 0.5 nm with a reproducibility of 0.1 nm.

Citation Download Citation

Peiyun Wu, Peifu Gu, Xu Liu, and Jinfa Tang "Development of an automatic spectrophotometer", Proc. SPIE 1994, Advanced Optical Manufacturing and Testing IV, (1 February 1994); https://doi.org/10.1117/12.168212

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