Paper
8 December 1995 Laser-induced damage in multilayer dielectric gratings due to ultrashort laser pulses
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Proceedings Volume 2633, Solid State Lasers for Application to Inertial Confinement Fusion (ICF); (1995) https://doi.org/10.1117/12.228281
Event: Solid State Lasers for Application to Inertial Confinement Fusion (ICF), 1995, Monterey, CA, United States
Abstract
Chirped pulse amplification is increasingly used to produce intense ultrashort laser pulses. When high efficiency gratings are the dispersive element, as in the LLNL Petawatt laser, their susceptibility to laser induced damage constitutes a limitation on the peak intensities that can be reached. To obtain robust gratings, it is necessary to understand the causes of short-pulse damage, and to recognize the range of design options for high efficiency gratings. Metal gratings owe their high efficiency to their high conductivity. To avoid the inevitable light absorption that accompanies conductivity, we have developed designs for high efficiency reflection gratings that use only transparent dielectric materials. These combine the reflectivity of a multilayer dielectric stack with a diffraction grating. We report here our present understanding of short-pulse laser induced damage, as it applies to dielectric gratings.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce W. Shore, Brent C. Stuart, Michael D. Feit, Alexander M. Rubenchik, and Michael D. Perry "Laser-induced damage in multilayer dielectric gratings due to ultrashort laser pulses", Proc. SPIE 2633, Solid State Lasers for Application to Inertial Confinement Fusion (ICF), (8 December 1995); https://doi.org/10.1117/12.228281
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Cited by 4 scholarly publications.
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KEYWORDS
Electrons

Dielectrics

Diffraction gratings

Laser damage threshold

Laser induced damage

Ultrafast phenomena

Ionization

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