Bulk damage monitor on MPTB

Andrew D. Holland; Nick Nelms; Ali Mohammadzadeh; Stephen J. Watts; Andrew Holmes-Siedle; Peter J. Pool

doi:10.1117/12.254049

18 October 1996 Bulk damage monitor on MPTB

Andrew D. Holland, Nick Nelms, Ali Mohammadzadeh, Stephen J. Watts, Andrew Holmes-Siedle, Peter J. Pool

Proceedings Volume 2811, Photonics for Space Environments IV; (1996) https://doi.org/10.1117/12.254049
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The microelectronics and photonics test bed (MPTB) operated by NRL is intended to provide an experimental platform for the evaluation of the effects of radiation damage on advanced microelectronic circuits and photonic devices. While several systems exist to monitor the accumulation of dose from ionizing radiation in space, little attention has been given to the accumulation of bulk damage in semiconductors. This is of increasing concern when using sensitive detectors for example for astronomical imaging or star-sensing. The bulk damage monitor experiment is designed as a prototype module to monitor the accumulation of bulk damage and uses a sensitive linear charge coupled device in a system designed to accurately monitor the effect of non- ionizing radiation. The experiment, which is light weight, with very low average power consumption and telemetry volume, may form one element in future dosimetry systems on- board spacecraft.

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Andrew D. Holland, Nick Nelms, Ali Mohammadzadeh, Stephen J. Watts, Andrew Holmes-Siedle, and Peter J. Pool "Bulk damage monitor on MPTB", Proc. SPIE 2811, Photonics for Space Environments IV, (18 October 1996); https://doi.org/10.1117/12.254049

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KEYWORDS

Charge-coupled devices

Sensors

Radiation effects

Space operations

Particles

Silicon

Electrons

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