Paper
15 October 1997 36-cm2 large monolythic pn-CCD detector for EPIC on XMM
Peter Holl, Heinrich W. Braeuninger, Ulrich G. Briel, Robert Hartmann, Gisela D. Hartner, D. Hauff, Josef Kemmer, Eckhard Kendziorra, Norbert Krause, Peter Lechner, Bernhard Maier, Norbert Meidinger, Elmar Pfeffermann, Bernhard Pflueger, Martin Popp, Claus Reppin, Rainer H. Richter, J. Riedel, Heike Soltau, Diana Stoetter, Lothar Strueder, Joachim E. Truemper, Christoph von Zanthier
Author Affiliations +
Abstract
Monolithic arrays of 12 CCDs, 3 by 1 cm2 each, have been developed and produced for the focal plane instrumentation of the European photon imaging camera (EPIC) on XMM and the German ABRIXAS x-ray satellite mission. The design parameters have been optimized to match the properties of the x-ray imaging optics as well as the x-ray intensity, energy bandwidth and characteristic time constants of the objects to observe. The pixel size is 150 by 150 micrometer2; readout is performed in parallel; low noise, spectroscopic performance is realized by on-chip integrated JFET electronics; highohmic, ultrapure bulk material allows full depletion and enhances the efficiency for higher energy x-ray detection. The fabrication process, the layout topology and the operating conditions guarantee for a ten year operation in space without performance degradation.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Holl, Heinrich W. Braeuninger, Ulrich G. Briel, Robert Hartmann, Gisela D. Hartner, D. Hauff, Josef Kemmer, Eckhard Kendziorra, Norbert Krause, Peter Lechner, Bernhard Maier, Norbert Meidinger, Elmar Pfeffermann, Bernhard Pflueger, Martin Popp, Claus Reppin, Rainer H. Richter, J. Riedel, Heike Soltau, Diana Stoetter, Lothar Strueder, Joachim E. Truemper, and Christoph von Zanthier "36-cm2 large monolythic pn-CCD detector for EPIC on XMM", Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); https://doi.org/10.1117/12.278910
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Cited by 10 scholarly publications.
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KEYWORDS
Charge-coupled devices

Semiconducting wafers

X-rays

Sensors

Cameras

Satellites

X-ray imaging

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