Visible Mueller matrix spectropolarimetry

Elizabeth A. Sornsin; Russell A. Chipman

doi:10.1117/12.283855

3 October 1997 Visible Mueller matrix spectropolarimetry

Elizabeth A. Sornsin, Russell A. Chipman

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.283855
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

A Mueller matrix spectropolarimeter operating between 400- 900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro- optic dispersion of a spatial light modulator will be presented.

Citation Download Citation

Elizabeth A. Sornsin and Russell A. Chipman "Visible Mueller matrix spectropolarimetry", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.283855

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