Paper
5 August 1998 Common-path interference profiler with nondestructive testing of a supersmooth surface
Yongying Yang, Yongmo Zhuo, Huashan Cheng
Author Affiliations +
Abstract
The paper described a double-focus interference profiler, its characteristics as below: There isn't standard reference mirror in the instrument. Non-destructive testing is operated for surface. It will be valid for rejecting various noises using interference and electronic common-mode processing system. All measurements are carried out by computer then surface roughness parameters are displayed. The results are compared with commercial WYKO and identity is very well. The instrument is suitable for testing nanometer and sub-nanometer surface, especially soft materials and films. The instrument has a sensitivity to height of 0.1 nm and the lateral sensitivity 1 micrometers .
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongying Yang, Yongmo Zhuo, and Huashan Cheng "Common-path interference profiler with nondestructive testing of a supersmooth surface", Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); https://doi.org/10.1117/12.318328
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Nondestructive evaluation

Silicon

Surface roughness

Glasses

Integrated optics

Semiconductor lasers

Surface finishing

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