Confocal photoluminescense microscopy in II-VI materials: annealing and degradation dynamics

Eithne M. McCabe; Christopher Jordan; D. T. Fewer; John F. Donegan; S. Taniguchi; T. Hino; Kazushi Nakano; Akira Ishibashi; Petteri Uusimaa; Markus Pessa

doi:10.1117/12.347591

6 May 1999 Confocal photoluminescense microscopy in II-VI materials: annealing and degradation dynamics

Eithne M. McCabe, Christopher Jordan, D. T. Fewer, John F. Donegan, S. Taniguchi, T. Hino, Kazushi Nakano, Akira Ishibashi, Petteri Uusimaa, Markus Pessa

Author Affiliations +

Proceedings Volume 3605, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI; (1999) https://doi.org/10.1117/12.347591
Event: BiOS '99 International Biomedical Optics Symposium, 1999, San Jose, CA, United States

Abstract

Confocal photoluminescence imaging is an important tool in the investigation of recombination in semiconductors and in the characterization of material growth. This characterization is particularly important for II-VI wide band-gap semiconductors where the potential for blue-green lasers is being explored currently. To achieve room-temperature cw operation of these lasers over the multi-thousand hours necessary for commercialization, extremely low defect densities are required. The confocal microscope is used in this work to image photoluminescence from II-VI materials to characterize the defect formation and propagation within the quantum well region of the material. This imaging approach permits the degradation to be monitored in real time and over a large area in samples with low defect densities. The additional advantages of this set-up over a conventional microscope are, of course, the higher lateral resolution and narrow depth of field associated with a confocal microscope. While considerable effort has been focused on the degradation in these II-VI semiconductors, we have recently observed that annealing can occur simultaneously in the same sample when the material is exposed to intense optical excitation. Images of annealing and degradation of a range of II-VI samples will be presented to highlight these observations.

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Eithne M. McCabe, Christopher Jordan, D. T. Fewer, John F. Donegan, S. Taniguchi, T. Hino, Kazushi Nakano, Akira Ishibashi, Petteri Uusimaa, and Markus Pessa "Confocal photoluminescense microscopy in II-VI materials: annealing and degradation dynamics", Proc. SPIE 3605, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI, (6 May 1999); https://doi.org/10.1117/12.347591

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