Paper
25 January 2002 Imaging spectrometers for future x-ray missions
Lothar Strueder, Gunther Hasinger, Johannes Kollmer, Norbert Krause, Norbert Meidinger, Joachim E. Truemper, Robert Hartmann, Peter Holl, Peter Lechner, Heike Soltau, Peter Klein, Gerhard Lutz, Rainer H. Richter, Peter Fischer, Norbert Wermes, Werner Buttler
Author Affiliations +
Abstract
Based on the operational experience with the EPIC pn-CCD system on board of XMM-Newton, new imaging X-ray spectroscopic detector systems for future X-ray missions will be introduced in terms of energy, position and time resolving detectors. As the readout speed requirement in the case of single photon coating detectors increases drastically with the collecting area and improved angular resolution, but noise figures have to be on the lowest possible level, new detector schemes must be developed: Active pixel sensors (APS) for X-ray detection have the capability to randomly select areas of interest and to operate at noise levels below 1 electron (rms). About 1000 frames per second can be read out with a relatively low level of electric power with the proposed DEPFET arrays. One prominent candidate for the use of an APS is ESA's XEUS 0 the X-ray Evolving Universe Spectroscopy mission. It represents a potential follow-on mission to the cornerstone XMM-Newton, currently in orbit. The XEUS mission is considered as part of ESA's Horizon 2000+ program within the context of the International Space Station (ISS).
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lothar Strueder, Gunther Hasinger, Johannes Kollmer, Norbert Krause, Norbert Meidinger, Joachim E. Truemper, Robert Hartmann, Peter Holl, Peter Lechner, Heike Soltau, Peter Klein, Gerhard Lutz, Rainer H. Richter, Peter Fischer, Norbert Wermes, and Werner Buttler "Imaging spectrometers for future x-ray missions", Proc. SPIE 4497, X-Ray and Gamma-Ray Instrumentation for Astronomy XII, (25 January 2002); https://doi.org/10.1117/12.454230
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Cited by 5 scholarly publications.
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KEYWORDS
Field effect transistors

Sensors

X-rays

Spectroscopy

Transistors

Signal processing

X-ray detectors

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