Paper
20 December 2001 Scanning transmission soft x-ray microscopy at beamline X-1A at the NSLS: advances in instrumentation and selected applications
Michael Feser, Tobias Beetz, Chris J. Jacobsen, Janos Kirz, Sue Wirick, Aaron Stein, Thorsten Schaefer
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Abstract
Soft x-ray scanning transmission x-ray microscopy allows one to image dry and wet environmental science, biological, polymer, and geochemical specimens on a nanoscale. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Recent results on Nomarski differential phase contrast and first results on investigations at the oxygen K edge and iron L edge of hydrous ferric oxide transformations are presented.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Feser, Tobias Beetz, Chris J. Jacobsen, Janos Kirz, Sue Wirick, Aaron Stein, and Thorsten Schaefer "Scanning transmission soft x-ray microscopy at beamline X-1A at the NSLS: advances in instrumentation and selected applications", Proc. SPIE 4506, Soft X-Ray and EUV Imaging Systems II, (20 December 2001); https://doi.org/10.1117/12.450955
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Cited by 12 scholarly publications.
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KEYWORDS
Iron

Sensors

X-ray microscopy

X-rays

Microscopes

Image segmentation

Oxides

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