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In this work, determination of the refractive index profile and the optical gap E02 of PbZr1-XTiO3 thin films is described. Measurements were performed with the J. A Woollam spectral ellipsometer working on rotate analyzer mode. The temperature dependence of optical constants was obtained with a specially designed heating device.
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Alexandr Deineka, Petr Pokorny, Lubomir Jastrabik, Gunnar Suchaneck, Gerald Gerlach, "Temperature-dependent spectral ellipsometry: a powerful technique for thin film investigations," Proc. SPIE 4888, First International Workshop on Classical and Quantum Interference, (22 July 2002); https://doi.org/10.1117/12.475877