High-power diode array reliability experiment

David J. Gallant; John Boeckl

doi:10.1117/12.501865

19 June 2003 High-power diode array reliability experiment

David J. Gallant, John Boeckl

Proceedings Volume 4973, High-Power Diode Laser Technology and Applications; (2003) https://doi.org/10.1117/12.501865
Event: High-Power Lasers and Applications, 2003, San Jose, CA, United States

Abstract

Performance degradation and lifetimes of high power diode arrays are important issues for laser manufacturers and end users. To fully understand these issues long term testing and failure analysis of arrays is required. To perform this testing we have set up an automated lifetime experiment to examine the characteristics of high power arrays over time. Subsequent material analysis of the arrays will uncover failure mechanisms.

Citation Download Citation

David J. Gallant and John Boeckl "High-power diode array reliability experiment", Proc. SPIE 4973, High-Power Diode Laser Technology and Applications, (19 June 2003); https://doi.org/10.1117/12.501865

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