Paper
19 May 2005 Class AB readout cell designed to reduce the noise of a concurrent continuous-time readout architecture for imaging systems
Author Affiliations +
Abstract
An alternative, class AB configuration of a proven class A readout cell for active/passive imaging systems is presented. Comparison between the two approaches shows that class AB circuit lowers power consumption and reduces noise by a factor of 3 while using nearly equal chip area. On the other hand, class AB has lower bandwidth because it operates at lower bias currents. A 0.5μm CMOS test chip that includes both types of readout circuits has been designed, fabricated and is currently being tested. Simulation results, using readout circuits from this test chip, are used to compare the two configurations.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mayra Sarmiento, Jorge Garcia, Fouad Kiamilev, and William Lawler "Class AB readout cell designed to reduce the noise of a concurrent continuous-time readout architecture for imaging systems", Proc. SPIE 5791, Laser Radar Technology and Applications X, (19 May 2005); https://doi.org/10.1117/12.605485
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Transistors

Imaging systems

Amplifiers

Photodetectors

Sensors

Computer programming

Device simulation

RELATED CONTENT

A 2048 X 64 Tapped Time Delay And Integration Charge...
Proceedings of SPIE (December 07 1988)
Design and realization of 144 x 7 TDI ROIC with...
Proceedings of SPIE (May 31 2012)
640 x 480 MOS PtSi IR sensor
Proceedings of SPIE (December 01 1991)
Memristor-based unit cell for a detector readout circuit
Proceedings of SPIE (September 08 2011)
Ultralow-noise infrared focal plane array status
Proceedings of SPIE (October 26 1998)
640 x 480 element PtSi IR sensor with low noise...
Proceedings of SPIE (September 01 1990)

Back to Top