Paper
29 January 2008 Developments at Finisar AOC
Author Affiliations +
Abstract
In 2007 Finisar® completed the transfer of an entire epitaxial and fabrication line from one facility to another. During this period, reliability models had to be re-validated and product continuity maintained. In this paper we describe the activities necessary to support such a transition, and we extend previously published VCSEL failure atlases.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Guenter, David Mathes, Bobby Hawkins, and Jim Tatum "Developments at Finisar AOC", Proc. SPIE 6908, Vertical-Cavity Surface-Emitting Lasers XII, 690805 (29 January 2008); https://doi.org/10.1117/12.771311
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Reliability

Semiconducting wafers

Failure analysis

Chemical elements

Data communications

Manufacturing

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