CZT smart dicing strategy for cost reduction using defect imaging and random-access machining

J. Eric Tkaczyk; Kristian Andreini; Tan Zhang; Kevin G. Harding; Gil Abramovich; Yana Williams; Christopher A. Nafis; Wenwu Zhang

doi:10.1117/12.865861

2 September 2010 CZT smart dicing strategy for cost reduction using defect imaging and random-access machining

J. Eric Tkaczyk, Kristian Andreini, Tan Zhang, Kevin G. Harding, Gil Abramovich, Yana Williams, Christopher A. Nafis, Wenwu Zhang

Author Affiliations +

Proceedings Volume 7806, Penetrating Radiation Systems and Applications XI; 78060L (2010) https://doi.org/10.1117/12.865861
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Current spectroscopic detector crystals contain defects that prevent economic production of devices with sufficient energy resolution and stopping power for radioisotope discrimination. This is especially acute for large monolithic crystals due to increased defect opportunity. The proposed approach to cost reduction starts by combining stereoscopic IR and ultrasound (UT) inspection coupled with segmentation and 3D mapping algorithms. A "smart dicing" system uses "random-access" laser-based machining to obtain tiles free of major defects. Application specific grading matches defect type to anticipated performance. Small pieces combined in a modular sensor pack instead of a monolith will make the most efficient use of wafer area.

Citation Download Citation

J. Eric Tkaczyk, Kristian Andreini, Tan Zhang, Kevin G. Harding, Gil Abramovich, Yana Williams, Christopher A. Nafis, and Wenwu Zhang "CZT smart dicing strategy for cost reduction using defect imaging and random-access machining", Proc. SPIE 7806, Penetrating Radiation Systems and Applications XI, 78060L (2 September 2010); https://doi.org/10.1117/12.865861

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