Christopher Nafis
at GE Research
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 14 May 2015 Paper
Proceedings Volume 9489, 948908 (2015) https://doi.org/10.1117/12.2177299
KEYWORDS: Composites, Light sources and illumination, Sensors, Cameras, Tolerancing, Head, Neodymium, Glasses, Manufacturing, Structured light

Proceedings Article | 14 September 2011 Paper
Proceedings Volume 8133, 81330P (2011) https://doi.org/10.1117/12.892765
KEYWORDS: Semiconducting wafers, Infrared imaging, Inspection, Sensors, Associative arrays, Wafer inspection, 3D image processing, Neodymium, Crystals, Ions

Proceedings Article | 3 September 2010 Paper
Proceedings Volume 7793, 77930I (2010) https://doi.org/10.1117/12.861038
KEYWORDS: Semiconducting wafers, Imaging systems, Light sources and illumination, Tellurium, Cameras, Inspection, Manufacturing, Near infrared, Sensors, Light scattering

Proceedings Article | 3 September 2010 Paper
Proceedings Volume 7806, 78060L (2010) https://doi.org/10.1117/12.865861
KEYWORDS: Sensors, Semiconducting wafers, Crystals, Image segmentation, Infrared imaging, Inspection, Laser cutting, 3D image processing, Ultrasonography, Image processing

Proceedings Article | 14 April 2010 Paper
Gil Abramovich, Kevin Harding, Swaminathan Manickam, Joseph Czechowski, Vijay Paruchuru, Robert Tait, Christopher Nafis, Arun Vemury
Proceedings Volume 7667, 766708 (2010) https://doi.org/10.1117/12.850708
KEYWORDS: Cameras, Polarization, 3D image processing, Image fusion, Refractive index, Image registration, Liquid crystals, Sensors, Data modeling, 3D modeling

Showing 5 of 12 publications
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